![[Analysis Case] Resistance Evaluation of Heterojunction Interface in CIGS Solar Cells](https://image.mono.ipros.com/public/product/image/985/2000026101/IPROS1055062992217362280.jpg?w=280&h=280)
[Analysis Case] Resistance Evaluation of Heterojunction Interface in CIGS Solar Cells
Evaluation of local resistance distribution using scanning spreading resistance microscopy (SSRM) under vacuum.
The heterojunction interface of ZnO/CdS/CIGS in CIGS thin-film solar cells was analyzed using the SSRM method, and the local resistance distribution was measured. By conducting measurements in a vacuum environment, we were able to remove adsorbed water from the measurement surface and achieve high spatial resolution. The measurement results indicate that we can measure the resistance values of each layer with nanometer-level spatial resolution. The resistance values of each layer differ by several orders of magnitude, indicating differences in carrier concentration. It was found that the CIGS layer has a higher resistance than the i-ZnO layer, and that CdS has an even higher resistance than these layers.
- Company：一般財団法人材料科学技術振興財団 MST
- Price：Other
![[SSRM] Scanning Spreading Resistance Microscopy](https://image.mono.ipros.com/public/product/image/a04/387108029/IPROS40969363157506370591.jpeg?w=280&h=280)
